Name
Abstract | ||
|---|---|---|
A delay-fault testing strategy based on the analysis ofpower supply transient signals is presented. The method isan extension to a Go/No-Go device testing method calledTransient Signal Analysis (TSA) [1]. TSA detects defectsthrough the analysis of a set of power supply transientwaveforms in the time or frequency domain, e.g., Fourierphase components. A recent extension to TSA demonstrateda correlation between the VDDT Fourier phasecomponents and path delays in defect-free devices [2]. Themethod proposed here is able to detect increases in delaydue to resistive shorting and open defects using a similartechnique. In particular, simulation results show that adelay defective device can be distinguished from adefect-free device through an anomaly in the Fourier phasecorrelation profile of the device. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/TEST.2001.966656 | ITC |
Keywords | Field | DocType |
no-go device testing method,adefect-free device,adelay defective device,power supply transient signal,analysis ofpower supply,delay-fault testing strategy,detecting delay fault,method isan extension,defect-free device,vddt fourier phasecomponents,detecting delay,fourier phasecorrelation profile,tsa detects,signal analysis,linear regression analysis,frequency domain,phase correlation,frequency domain analysis,fault detection,statistical analysis,test methods | Frequency domain,Signal processing,Computer science,Fault detection and isolation,Resistive touchscreen,Waveform,Real-time computing,Electronic engineering,Fourier transform,Test strategy,Phase correlation | Conference |
ISSN | ISBN | Citations |
1089-3539 | 0-7803-7169-0 | 8 |
PageRank | References | Authors |
0.81 | 9 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Abhishek Singh | 1 | 23 | 2.93 |
| Chintan Patel | 2 | 385 | 37.44 |
| Shirong Liao | 3 | 8 | 1.14 |
| James F. Plusquellic | 4 | 109 | 15.02 |
| Anne E. Gattiker | 5 | 121 | 16.69 |