Name
Abstract | ||
|---|---|---|
This paper presents the application of the oscillation test methodology as an alternative to test configurable analog blocks of Field Programmable Analog Arrays. The blocks of the device under test are first configured to behave as oscillators. Then, the output frequency and amplitude are observed to obtain the signature of the fault-free circuit. During test, this signature is compared to the actual output signal. Experimental results show the effectiveness of the method in detecting parametric and large deviation faults of the tested components. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1007/s10836-005-6143-4 | J. Electronic Testing |
Keywords | Field | DocType |
analog testing,FPAA test,Oscillation Test Strategy (OTS),Built-In Self Test (BIST) | Test method,Oscillation,Device under test,Computer science,Real-time computing,Electronic engineering,Parametric statistics,Field-programmable analog array,Test strategy,Amplitude | Journal |
Volume | Issue | ISSN |
21 | 2 | 0923-8174 |
Citations | PageRank | References |
4 | 0.57 | 13 |
Authors | ||
5 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Tiago R. Balen | 1 | 53 | 12.21 |
| Antonio Q. Andrade, Jr. | 2 | 4 | 0.57 |
| Florence Azaïs | 3 | 46 | 6.58 |
| Marcelo Lubaszewski | 4 | 483 | 47.66 |
| Michel Renovell | 5 | 749 | 96.46 |