Abstract | ||
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This work presents a novel scheme of built-in current sensor (BICS) for detecting transient fault-based attacks of short and long duration as well as from different simultaneous sources. The new sensor is a single mechanism connected to PMOS and NMOS bulks of the monitored logic. The proposed protection strategy is also useful for improving any state-of-the-art Bulk-BICS from pairs of PMOS and NMOS sensors to single sensors. |
Year | DOI | Venue |
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2013 | 10.1109/HST.2013.6581565 | HOST |
Keywords | Field | DocType |
fault tolerance,cmos integrated circuits,transistors,security | NMOS logic,Computer science,Electronic engineering,Real-time computing,Fault tolerance,Current sensor,PMOS logic,Fault indicator | Conference |
ISBN | Citations | PageRank |
978-1-4799-0559-1 | 5 | 0.54 |
References | Authors | |
13 | 6 |
Name | Order | Citations | PageRank |
---|---|---|---|
Rodrigo Possamai Bastos | 1 | 80 | 13.80 |
Frank Sill Torres | 2 | 70 | 14.65 |
Jean-Max Dutertre | 3 | 313 | 29.14 |
Marie-Lise Flottes | 4 | 366 | 45.31 |
Giorgio Di Natale | 5 | 368 | 54.26 |
Bruno Rouzeyre | 6 | 456 | 49.44 |