Name
Title | ||
|---|---|---|
An At-Speed Test Technique for High-Speed High-order Adder by a 6.4-GHz 64-bit Domino Adder Example. |
Abstract | ||
|---|---|---|
This work presents the first case of using the pseudoexhaustive testing (PET) for high-speed high-order (>;32 -bit) adders. It is shown that all single stack-at faults are detected by a pseudoexhaustive test set of 54 K patterns, compared to 264×2 patterns in the past. Also, all transition faults are detected by a pseudoexhaustive test set of 13 M patterns, compared to 264×4 patterns in the past. ... |
Year | DOI | Venue |
|---|---|---|
2012 | 10.1109/TCSI.2012.2206503 | IEEE Transactions on Circuits and Systems I: Regular Papers |
Keywords | Field | DocType |
Adders,Circuit faults,Clocks,Positron emission tomography,Testing,Delay,Strontium | Adder,Latency (engineering),Computer science,Speed test,Electronic engineering,CMOS,Domino,Carry-save adder,Serial binary adder,Test set | Journal |
Volume | Issue | ISSN |
59 | 8 | 1549-8328 |
Citations | PageRank | References |
1 | 0.46 | 15 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yu-shun Wang | 1 | 140 | 31.90 |
| Min-Han Hsieh | 2 | 7 | 3.69 |
| James Chien-Mo Li | 3 | 187 | 27.16 |
| Charlie Chung-Ping Chen | 4 | 1396 | 137.82 |