Name
Title | ||
|---|---|---|
A Pre- and Post-bond Self-Testing and Calibration Methodology for SAR ADC Array in 3-D CMOS Imager |
Abstract | ||
|---|---|---|
This paper presents a low-cost pre- and post-bond self-testing and calibration methodology for the successive approximation register (SAR) analog-to-digital converter (ADC) array in a three-dimensional (3-D) CMOS imager. The basic idea is to test and calibrate the SAR ADC by measuring the major carrier transitions (MCTs) of the internal digital-to-analog converter (DAC) capacitor array. During the pre-bond stage, when access to the die is very limited, we propose a calibration-oriented testing technique that only determines whether the ADC array can achieve the desired performance after calibration. This substantially reduces the required design-for-test (DfT) circuitry complexity and test time. Then, during the post-bond stage, more thorough characterization on the ADC array is performed, we utilize digital resources from the image signal processor (ISP) die to analyze the measurement results, compute the calibration parameters, and perform the digital calibration. Simulation results are presented to validate the proposed techniques. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/ETS.2011.39 | European Test Symposium |
Keywords | Field | DocType |
pre-bond self-testing,integrated circuit testing,analog-to-digital converter array,analogue-digital conversion,cmos image sensors,3-d cmos imager,successive approximation register,digital calibration,calibration parameter,calibration-oriented testing,three-dimensional integrated circuits,3d cmos imager,sar adc,post-bond self-testing,adc array,sar adc array,pre-,analog-to-digital converter,design for testability,mixed-signal testing,capacitor array,design-for-test,post-bond testing,3-d ic testing,image signal processor,major carrier transitions,digital resource,calibration methodology,internal digital-to-analog converter,linearity,three dimensional,capacitors,calibration,design for test,registers,switches,testing | Design for testing,Capacitor,Computer science,Linearity,Shaping,Electronic engineering,CMOS,Successive approximation ADC,Calibration,Digital resources | Conference |
ISSN | ISBN | Citations |
1530-1877 E-ISBN : 978-0-7695-4433-5 | 978-0-7695-4433-5 | 2 |
PageRank | References | Authors |
0.44 | 5 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Xuan-Lun Huang | 1 | 23 | 5.33 |
| Ping-Ying Kang | 2 | 10 | 1.56 |
| Jiun-Lang Huang | 3 | 263 | 35.90 |
| Yung-Fa Chou | 4 | 244 | 23.76 |
| Yung-Pin Lee | 5 | 100 | 17.18 |
| Ding-Ming Kwai | 6 | 521 | 46.85 |