Name
Abstract | ||
|---|---|---|
In this paper, we first explore sub-threshold Fin-FET circuits design space, finding their optimal power supply point for minimum energy consumption. We then study soft error vulnerability in sub-threshold region. Our experiments indicate that the energy consumption in sub-threshold region can achieve 4 orders of magnitude energy saving. Compared to bulk CMOS technology, FinFET circuits have lower functional power supply and lower optimal energy consumption in subthreshold region. In addition, FinFET has better soft error immunity in sub-threshold region. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/SOCC.2006.283853 | IEEE INTERNATIONAL SOC CONFERENCE, PROCEEDINGS |
Keywords | Field | DocType |
circuit design,integrated circuit design,low power electronics,soft error | Orders of magnitude (numbers),Soft error,Computer science,CMOS,Real-time computing,Electronic engineering,Integrated circuit design,Subthreshold conduction,Electronic circuit,Electrical engineering,Energy consumption,Low-power electronics | Conference |
ISSN | Citations | PageRank |
2164-1676 | 7 | 0.79 |
References | Authors | |
5 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Xiaoxia Wu | 1 | 535 | 38.61 |
| Feng Wang | 2 | 136 | 7.44 |
| Yuan Xie | 3 | 6430 | 407.00 |