Paper Info
Title
Noise Analysis of Fault Tolerant Active Pixel Sensors
Abstract
As digital imagers grow in pixel count and area, the ability to correct for pixel defects becomes more important. A fault tolerant Active Pixel Sensor (APS) has previously been designed and fabricated that can correct for stuck high and stuck low defects. Analyses of the pixel noise for a standard APS and a fault tolerant APS are presented that consider reset noise, photocurrent shot noise, dark current shot noise, transistor thermal noise, transistor flicker noise, operational amplifier noise, and feedback resistor thermal noise. Under worst case conditions (no illumination), the noise of the fault tolerant APS is 1.106脳 more than a standard APS. At a typical illumination level, the fault tolerant APS noise is nearly unchanged to that of a standard APS. Previous research has shown that the fault tolerant APS is more sensitive than a standard APS, thus the overall signal-to-noise ratio of the fault tolerant APS should be greater than the standard APS except under very low light conditions.
Year
DOI
Venue
2005
10.1109/DFTVS.2005.48
DFT
Keywords
Field
DocType
active pixel sensors,pixel noise,photocurrent shot noise,dark current shot noise,fault tolerant,fault tolerant aps,transistor flicker noise,fault tolerant aps noise,feedback resistor thermal noise,standard aps,noise analysis,reset noise,operational amplifier noise,fault tolerance,flicker noise,thermal noise,operational amplifier,signal to noise ratio,active pixel sensor,shot noise,dark current
Flicker noise,Computer science,Noise (electronics),CMOS sensor,Dark current,Electronic engineering,Resistor,Pixel,Shot noise,Electrical engineering,Operational amplifier
Conference
ISSN
ISBN
Citations 
1550-5774
0-7695-2464-8
0
PageRank 
References 
Authors
0.34
3
5
Name
Order
Citations
PageRank
Cory Jung172.34
mohammad izadi200.34
Michelle L. La Haye331.60
Glenn H. Chapman416734.10
Karim S. Karim554.06