Name
Abstract | ||
|---|---|---|
The use of the Oscillation Test Strategy to testConfigurable Analog Blocks of Field ProgrammableAnalog Arrays (FPAAs) has been proposed previously,solving the complex problem of test stimuli generation.An improvement to that technique is presented in thispaper, using the resources of the FPAA to build an OutputResponse Analyzer. This new approach offers a full Built-In Self-Test scheme with no area overhead and requiring a low cost Automatic Test Equipment. Experiments showthe efficiency of the approach in detecting parametricfaults of the tested components. |
Year | DOI | Venue |
|---|---|---|
2004 | 10.1109/VTEST.2004.1299268 | VTS |
Keywords | Field | DocType |
field programmable gate arrays,oscillations,field programmable analog array,fpaa,fault detection,prototypes,analog circuits,automatic test equipment | Automatic test pattern generation,Computer science,Automatic test equipment,Programmable logic array,Simple programmable logic device,Electronic engineering,Parametric statistics,Field-programmable analog array,Test strategy,Built-in self-test | Conference |
ISSN | ISBN | Citations |
1093-0167 | 0-7695-2134-7 | 8 |
PageRank | References | Authors |
0.75 | 5 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Tiago R. Balen | 1 | 53 | 12.21 |
| Antonio Andrade Jr. | 2 | 24 | 2.58 |
| Florence Azaïs | 3 | 46 | 6.58 |
| Marcelo Lubaszewski | 4 | 483 | 47.66 |
| Michel Renovell | 5 | 749 | 96.46 |
| Andrade, A., Jr. | 6 | 8 | 0.75 |