Name
Title | ||
|---|---|---|
Extraction error modeling and automated model debugging in high-performance custom designs |
Abstract | ||
|---|---|---|
In the design cycle of high-performance integrated circuits, it is common that certain components are designed directly at the transistor level. This level of design representation may not be appropriate for test generation tools that usually require a model expressed at the gate level. Logic extraction is a key step in test model generation to produce a gate-level netlist from the transistor-level representation. This is a semi-automated process which is error-prone. Once a test model is found to be erroneous, manual debugging is required, which is a resource-intensive and time-consuming process. This paper presents an in-depth analysis of typical sets of extraction errors found in the test model representations of the pipelines in high-performance designs today. It also develops an automated debugging solution for single extraction errors for pipelines with no state equivalence information. A suite of experiments on circuits with similar architecture to that found in the industry confirms the fitness and practicality of the solution |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/TVLSI.2006.878346 | IEEE Trans. VLSI Syst. |
Keywords | Field | DocType |
automated model,gate-level netlist,manual debugging,test generation tool,gate level,extraction error modeling,test model representation,error analysis,test model generation,high-performance custom design,errors,extraction error,high-performance integrated circuits,system-on-chip,test model,single extraction error,logic extraction,logic design,vlsi,index terms—debugging,integrated circuit design,automated debugging solution,debugging,automated model debugging,vlsi.,transistor level,extraction,system testing,integrated circuit,sequential circuits,pipelines,indexing terms,data mining,very large scale integration,system on chip | Logic synthesis,Netlist,Test method,Sequential logic,Computer science,System testing,Real-time computing,Electronic engineering,Integrated circuit design,Very-large-scale integration,Debugging | Journal |
Volume | Issue | ISSN |
14 | 7 | 1063-8210 |
Citations | PageRank | References |
2 | 0.39 | 15 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yu-Shen Yang | 1 | 92 | 8.23 |
| A. Veneris | 2 | 937 | 67.52 |
| Paul Thadikaran | 3 | 9 | 2.58 |
| Srikanth Venkataraman | 4 | 572 | 48.05 |