Name
Abstract | ||
|---|---|---|
Increasing leakage currents combined with reduced noise margins significantly degrade the robustness of wide dynamic circuits. In this paper, we describe two conditional keeper topologies for improving the robustness of sub-130-nm wide dynamic circuits. They are applicable in normal mode of operation as well as during burn-in test. A large fraction of the keepers is activated conditionally, allowi... |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1109/4.997857 | IEEE Journal of Solid-State Circuits |
Keywords | DocType | Volume |
Noise robustness,Leakage current,Circuit noise,Noise level,Delay,Degradation,Noise reduction,Circuit topology,Circuit testing,Microprocessors | Journal | 37 |
Issue | ISSN | Citations |
5 | 0018-9200 | 72 |
PageRank | References | Authors |
11.36 | 1 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| A. Alvandpour | 1 | 108 | 14.03 |
| R. K. Krishnamurthy | 2 | 175 | 35.93 |
| K. Soumyanath | 3 | 205 | 27.70 |
| Shekhar Borkar | 4 | 4236 | 494.95 |