Name
Abstract | ||
|---|---|---|
No abstract available.
|
Year | DOI | Venue |
|---|---|---|
1999 | 10.1109/ICCAD.1999.810695 | ICCAD |
Keywords | DocType | ISBN |
deep submicron defect detection,energy consumption ratio,leakage current,integrated circuit design,process variation,electromagnetics,test methods | Conference | 0-7803-5832-5 |
Citations | PageRank | References |
4 | 0.44 | 11 |
Authors | ||
1 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Bapiraju Vinnakota | 1 | 237 | 25.36 |