Name
Abstract | ||
|---|---|---|
In this paper, a new dynamic supply current testmethod is proposed for detecting open defects on signallines in CMOS logic circuits. The method is based on theappearance time of dynamic supply current that flowswhen a test input vector is provided to a circuit under test.Also, we introduce our designed sensor circuit of theappearance time. Feasibility of tests based on the testmethod is examined by some experiments. Theexperimental results show that open defects on signallines in CMOS logic circuits will be detected by the testmethod. |
Year | Venue | Keywords |
|---|---|---|
2004 | DELTA | sensor circuit,dynamic supply current,cmos open fault detection,switching supply current,test input vector,cmos logic circuit,new dynamic supply,theexperimental result,theappearance time,current testmethod,open defect,appearance time,test methods,fault detection |
DocType | ISBN | Citations |
Conference | 0-7695-2081-2 | 1 |
PageRank | References | Authors |
0.44 | 4 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Masaki Hashizume | 1 | 98 | 27.83 |
| Tetsuo Akita | 2 | 1 | 0.44 |
| Hiroyuki Yotsuyanagi | 3 | 70 | 19.04 |
| Takeomi Tamesada | 4 | 45 | 12.49 |