Title
Low-cost testing of 5 GHz low noise amplifiers using new RF BIST circuit
Abstract
This paper presents a new low-cost RF BIST (Built-In Self-Test) scheme that is capable of measuring input impedance, gain, noise figure and input return loss for a low noise amplifier (LNA) in RF systems. The RF BIST technique requires an additional RF amplifier and two peak detectors, and its output is a DC voltage level. The BIST circuit is designed using 0.18 µm SiGe technology. The test technique utilizes output DC voltage measurements and these measured values are translated into the LNA specifications such as input impedance and gain using the developed mathematical equations. Simulation results are presented for an LNA working at 5 GHz. Measurement data are compared with simulation results to validate the developed mathematical equations. The technique is simple and inexpensive.
Year
DOI
Venue
2005
10.1007/s10836-005-3735-y
J. Electronic Testing
Keywords
Field
DocType
noise figure,low noise amplifier,rfic
Low-noise amplifier,Computer science,Noise figure,Instrumentation amplifier,Noise temperature,Electronic engineering,Y-factor,Effective input noise temperature,RF power amplifier,Electrical engineering,Amplifier
Journal
Volume
Issue
ISSN
21
6
0923-8174
Citations 
PageRank 
References 
6
0.70
7
Authors
2
Name
Order
Citations
PageRank
Jee-Youl Ryu1336.13
Bruce C. Kim28921.11