Paper Info
Title
Automatic diagnostic tool for Analog-Mixed Signal and RF load boards.
Abstract
This paper describes a low cost test technique for testing Analog-Mixed Signal and RF load boards used in ATE (Automatic Test Equipment). The paper describes the development and application of a software tool for automatic analysis and test generation for mixed signal and RF circuits on Device Interface Boards (DIB). DIBs are essential components for testing ICs and they contain mixed-signal and RF circuits with several active and passive components that are needed to simulate test conditions for ICs. The software tool utilizes the schematic information of DIBs to generate tests for components and interconnectivity on the DIB. The tests generated are dependent upon the accessibility and programmability provided by the test hardware as well as the testability provided by DIB design. The output of the tool is a generic test specification that is independent of test hardware platform. Automatic test generation saves on the manual labor for writing DIB tests and thus contributing to the reduction of time to market for ICs.
Year
DOI
Venue
2009
10.1109/TEST.2009.5355836
ITC
Keywords
Field
DocType
testing,mixed signal circuits,rf circuits,interconnectivity,design for testability,automatic test equipment,radio frequency,testability,mmic,automatic test pattern generation,accessibility
Testability,Design for testing,Automatic test pattern generation,Automatic test equipment,Computer science,Electronic engineering,Schematic,Mixed-signal integrated circuit,Test compression,Electronic component,Embedded system
Conference
ISSN
ISBN
Citations 
1089-3539
978-1-4244-4867-8
0
PageRank 
References 
Authors
0.34
0
2
Name
Order
Citations
PageRank
Sukeshwar Kannan1296.43
Bruce C. Kim28921.11