Name
Abstract | ||
|---|---|---|
This paper proposes a new per-test fault diagnosis method based on the X-fault model. The X-fault model can represent all possible faulty behaviors of a physical defect or defects in a gate and/or on its fanout branches by assigning different X symbols assigned to the fanout branches. A partial symbolic fault simulation method is proposed for the X-fault model. Then, a novel technique is proposed for extracting more diagnostic information by analyzing matching details between observed and simulated responses. Furthermore, a unique method is proposed to score the results of fault diagnosis. Experimental results on benchmark circuits demonstrate the superiority of the proposed method over conventional per-test fault diagnosis based on the stuck-at fault model. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1093/ietisy/e89-d.11.2756 | IEICE Transactions |
Keywords | Field | DocType |
per-test fault diagnosis method,fault diagnosis,x-fault model,fanout branch,benchmark circuit,stuck-at fault model,new per-test fault diagnosis,unique method,partial symbolic fault simulation,conventional per-test fault diagnosis,fault model | Stuck-at fault,Test method,Fault coverage,Computer science,Algorithm,Information extraction,Symbolic data analysis,Fan-out,Electronic circuit,Fault model | Journal |
Volume | Issue | ISSN |
E89-D | 11 | 1745-1361 |
Citations | PageRank | References |
1 | 0.35 | 0 |
Authors | ||
7 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Xiaoqing Wen | 1 | 790 | 77.12 |
| Seiji Kajihara | 2 | 989 | 73.60 |
| Kohei Miyase | 3 | 562 | 38.71 |
| Yuta Yamato | 4 | 138 | 9.45 |
| Kewal K. Saluja | 5 | 1483 | 141.49 |
| Laung-terng Wang | 6 | 601 | 44.22 |
| Kozo Kinoshita | 7 | 756 | 118.08 |