Name
Abstract | ||
|---|---|---|
In this study the authors show how the interface between automatic test equipment (ATE) and on-chip decompression logic can be improved by a smart reuse of the scan chains. Storing the parent patterns of a modular decompression scheme in groups of scan chains avoids multiple loads from the ATE and thus reduces the test time. The presented algorithm for scan chain selection allows a flexible bandwi... |
Year | DOI | Venue |
|---|---|---|
2013 | 10.1109/MDT.2012.2184072 | IEEE Design & Test |
Keywords | DocType | Volume |
Automatic test equipment,Logic gates,Encoding,System-on-a-chip,Data storage,Phase shifters,Multiplexing,Storage automation | Journal | 30 |
Issue | ISSN | Citations |
1 | 2168-2356 | 4 |
PageRank | References | Authors |
0.41 | 9 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Dariusz Czysz | 1 | 202 | 8.21 |
| Grzegorz Mrugalski | 2 | 501 | 35.90 |
| Nilanjan Mukherjee | 3 | 801 | 57.26 |
| Janusz Rajski | 4 | 2460 | 201.28 |
| Jerzy Tyszer | 5 | 838 | 74.98 |