Name
Abstract | ||
|---|---|---|
An unclonable system for product authentication in anti-counterfeiting has been implemented in standard 90 nm CMOS technology. The circuit exploits the intrinsic variability of the electrical characteristics of minimum size MOSFETs, in order to generate a physical one-way function that univocally identifies each particular IC. Effects of temperature, voltage supply and process variations have been internally compensated to obtain a robust and reliable behavior. Experimental measurements show that the circuit exhibits 30 mu W power consumption, a bit error rate in response to a challenge smaller than 0.4% at 125 C or with a 10% voltage supply variation. Accelerated aging tests provide an estimate of a lifetime much in excess of the ten-year requirement. The very low power consumption makes the circuit also feasible for integration in RFID transponders. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1109/ESSCIRC.2008.4681809 | Proceedings of the European Solid-State Circuits Conference |
Keywords | DocType | ISSN |
authentication,process variation,bit error rate,cmos integrated circuits,one way function,delta modulation,temperature measurement | Conference | 1930-8833 |
Citations | PageRank | References |
9 | 0.73 | 5 |
Authors | ||
3 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| D. Puntin | 1 | 23 | 1.66 |
| S. Stanzione | 2 | 23 | 1.66 |
| Giuseppe Iannaccone | 3 | 152 | 24.49 |