Paper Info
Title
Gentest: an automatic test-generation system for sequential circuits
Abstract
A description is given of Gentest, with emphasis on STG2, a sequential test generator that uses the Back test-generation algorithm and the Split value model. The performance of STG2 on a Convex C-1 computer is compared with that of its predecessor, STG1 and STG1.5. Results are also presented for another set of experiments for Gentest on a Sun 3/60 workstation.<>
Year
DOI
Venue
1989
10.1109/2.25381
IEEE Computer
Keywords
DocType
Volume
sequential circuits,integrated circuit testing,test-generation algorithm,convex c-1 computer,Convex C-1 computer,circuit analysis computing,STG2,Gentest,BIST,integrated logic circuits,sequential test generator,VLSI,Split value model,split value model,automatic test-generation system,Sun 3/60 workstation,logic testing,Back test-generation algorithm
Journal
22
Issue
ISSN
Citations 
4
0018-9162
115
PageRank 
References 
Authors
11.15
8
2
Search Limit
100115
Name
Order
Citations
PageRank
Wu-tung Cheng11350121.45
Tapan J. Chakraborty225826.11