Title
Single-event-upset (SEU) awareness in FPGA routing
Abstract
The majority of configuration bits affecting a design are devoted to FPGA routing configuration. We present a SEU-aware routing algorithm that provides significant reduction in bridging faults caused by SEUs. Depending on the routing architecture switches, for MCNC benchmarks, the number of care bits can be reduced between 13% and 19% on average with comparable delay. In addition, in Asymmetric SRAM FPGA using our router average FIT (failure-in-time) rate is reduced by 36%.
Year
DOI
Venue
2007
10.1145/1278480.1278564
Proceedings of the 50th Annual Design Automation Conference
Keywords
Field
DocType
circuit design,testing,computer science,failure analysis,network routing,reliability,soft error,field programmable gate arrays,switches,integrated circuit design,theory,routing,algorithm design and analysis,design,algorithms,computer architecture
Algorithm design,Soft error,Computer science,Bridging (networking),Field-programmable gate array,Real-time computing,Static random-access memory,Electronic engineering,Integrated circuit design,Router,Single event upset,Embedded system
Conference
ISSN
ISBN
Citations 
0738-100X
978-1-59593-627-1
17
PageRank 
References 
Authors
0.81
7
2
Name
Order
Citations
PageRank
S. Golshan1384.10
Elaheh Bozorgzadeh263037.93