Name
Abstract | ||
|---|---|---|
In this paper, a new test set embedding method with re-seeding for scan-based testing is proposed. The bit sequences of multiple cells of an LFSR, which is used as test pattern generator, are exploited for effectively encoding the test set of the core under test (multiphase architecture). A new algorithm which comprises four heuristic criteria is introduced for efficiently selecting the required seeds and LFSR cells. Also, a cost metric for assessing the quality of the algorithm's results is proposed. By using this metric, the process of determining proper values for the algorithm's input parameters is significantly simplified. The proposed method compares favorably with the most recent and effective test set embedding techniques in the literature |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/ISQED.2006.56 | San Jose, CA |
Keywords | Field | DocType |
heuristic criterion,embedding method,scan-based testing,effective test,efficient multiphase test set,bit sequence,new algorithm,new test,input parameter,lfsr cell,test pattern generator,system testing,sequential analysis,encoding,informatics,lfsr,sleep mode,automatic test pattern generation,shift registers | Domino logic,Automatic test pattern generation,Heuristic,Shift register,Test set embedding,Computer science,Real-time computing,Electronic engineering,Sleep mode,Encoding (memory),Test set | Conference |
ISBN | Citations | PageRank |
0-7695-2523-7 | 5 | 0.44 |
References | Authors | |
12 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| E. Kalligeros | 1 | 113 | 6.90 |
| X. Kavousianos | 2 | 161 | 12.90 |
| D. Nikolos | 3 | 291 | 31.38 |