Title
Non-RF to RF Test Correlation Using Learning Machines: A Case Study
Abstract
Multiple Input Multiple Output (MIMO) based systems have recently received a lot of attention as their projected data rate is twice as fast as the currently available systems. Due to the increased number of RF paths, the testing becomes more complicated, ...
Year
DOI
Venue
2007
10.1109/VTS.2007.41
VTS
Keywords
Field
DocType
available system,multiple input multiple output,rf test correlation,case study,learning machines,increased number,rf path,projected data rate,radio frequency,learning artificial intelligence,production,neural network,predictive models,machine learning,compaction,neural nets,conformance testing,neural networks
Analogue circuits,Computer science,Production testing,Conformance testing,Radio frequency,Electronic engineering,Correlation,Test data,Specification testing,Artificial neural network
Conference
ISSN
ISBN
Citations 
1093-0167
0-7695-2812-0
38
PageRank 
References 
Authors
2.10
12
4
Name
Order
Citations
PageRank
Haralampos-G. D. Stratigopoulos125228.06
Petros Drineas22165201.55
Mustapha Slamani313417.09
Yiorgos Makris41365107.21