Name
Title | ||
|---|---|---|
Dynamically partitioned test scheduling with adaptive TAM configuration for power-constrained SoC testing |
Abstract | ||
|---|---|---|
Given a system-on-chip with a set of cores and a set of test resources, and the constraints on the total power consumption during test and the maximum width on the top-level test access mechanism (TAM), it is required to optimize overall testing time of the system. To solve this problem, we first generate a power-constrained test compatibility graph and then construct a set of power-constrained concurrent test sets (PCTSs) to facilitate concurrent testing. We then handle the constrained scheduling by adaptively assigning the cores in parallel to the TAMs with variable width and efficiently utilizing the TAM bandwidth such that the tests in the same PCTS have their lengths close to each other. We concurrently schedule the test sets by dynamically partitioning and allocating the tests, and consequently constructing and updating a set of dynamically partitioned PCTSs. This reduces the test cost in terms of overall test time. Simulation study shows the productivity gained by using our integrated scheduling approach. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/TCAD.2005.847893 | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
Keywords | DocType | Volume |
power-constrained test compatibility graph,system-on-chip testing,integrated circuit testing,power-constrained SoC testing,scheduling,power consumption,power constraint,overall test time,test resource,adaptive tam configuration,test set,Adaptive test access mechanism (TAM) configuration,integrated scheduling,dynamically partitioning,test access mechanism,adaptive TAM configuration,logic partitioning,test cost,dynamically partitioned pctss,system-on-chip,power-constrained soc testing,system-on-chip (SoC) test,constrained scheduling,power-constrained concurrent test sets,dynamically partitioned test scheduling,top-level test access mechanism,test compatibility,concurrent testing,dynamic test partitioning,power-constrained concurrent test set | Journal | 24 |
Issue | ISSN | Citations |
6 | 0278-0070 | 19 |
PageRank | References | Authors |
0.87 | 21 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| D. Zhao | 1 | 32 | 2.34 |
| S. Upadhyaya | 2 | 81 | 7.01 |