Name
Year | DOI | Venue |
|---|---|---|
2013 | 10.1109/SBCCI.2013.6644860 | SBCCI |
Keywords | Field | DocType |
combinational circuits,negative bias temperature instability,sequential circuits,ageing | Sequential logic,Pass transistor logic,FLOPS,Computer science,Combinational logic,CMOS,Electronic engineering,Negative-bias temperature instability,Integrated injection logic,Very-large-scale integration | Conference |
Citations | PageRank | References |
2 | 0.47 | 14 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Cicero Nunes | 1 | 13 | 1.59 |
| Paulo F. Butzen | 2 | 48 | 11.13 |
| André Inácio Reis | 3 | 134 | 21.33 |
| Renato P. Ribas | 4 | 204 | 33.52 |