Name
Abstract | ||
|---|---|---|
Abstract: We describe the design and implementation of an IEEE P1500 compliant programmable BIST for embedded memories. The proposed design can be embedded in other cores or systems with minimum test generation or test application overhead. The programmability of our BIST is useful when the algorithm is being refined while the memory architecture is under production. A variety of test algorithms can be implemented with the programmability provided in our design with no change to the BIST hardware. As an example we demonstrate the implementation of an algorithm to detect open decoder faults. This example is shown for its didactic content as it brings out the programmable axis of our design. Our design also offers means to perform dedicated delay tests as well as scan tests for diagnosis. We show by synthesis experiments that the extra area cost for the BIST hardware is relatively small for medium to large memories. |
Year | DOI | Venue |
|---|---|---|
2001 | 10.1109/MTDT.2001.945224 | MTDT |
Keywords | Field | DocType |
ieee p1500,compliant programmable bist,p1500 compliant programable bistshell,delay test,minimum test generation,programmable axis,embedded memory,test application overhead,test algorithm,bist hardware,proposed design,refining,decoding,production,fault detection,hardware,system testing,algorithm design and analysis,diagnosis | Programmable circuits,Algorithm design,Test algorithm,Fault detection and isolation,System testing,Computer science,Decoding methods,Memory architecture,Built-in self-test,Embedded system | Conference |
ISSN | Citations | PageRank |
1087-4852 | 1 | 0.37 |
References | Authors | |
4 | 6 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Sandeep Koranne | 1 | 70 | 7.25 |
| Tom Waayers | 2 | 128 | 11.47 |
| Robert Beurze | 3 | 1 | 0.37 |
| Clemens Wouters | 4 | 28 | 3.96 |
| Sunil Kumar | 5 | 1 | 0.37 |
| G. S. Visweswaran | 6 | 45 | 10.68 |