Name
Year | DOI | Venue |
|---|---|---|
2002 | 10.1002/scj.1128 | Systems and Computers in Japan |
Keywords | Field | DocType |
controller | Design for testing,Computer science,Test sequence,Operating speed,Combinational logic,Artificial intelligence,Computer engineering,Computer vision,Automatic test pattern generation,Control theory,Algorithm,Finite-state machine,Test compression | Journal |
Volume | Issue | Citations |
33 | 5 | 0 |
PageRank | References | Authors |
0.34 | 3 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Satoshi Ohtake | 1 | 135 | 21.62 |
| Toshimitsu Masuzawa | 2 | 635 | 91.06 |
| Hideo Fujiwara | 3 | 193 | 25.87 |