Name
Abstract | ||
|---|---|---|
A testability analysis technique for built-in self-test (BIST) at the system level is presented. While based on previous approaches, the model has several significant new features, including an iterative technique for modeling indirect feedback and an extension to the circular BIST methodology. Additionally, a new preprocessing transformation enables the correct modeling of word-level correlation. Examples validate the model, and demonstrate its applicability to test point insertion. |
Year | DOI | Venue |
|---|---|---|
1995 | 10.1109/ICCD.1995.528805 | ICCD |
Keywords | Field | DocType |
correct modeling,new preprocessing transformation,testability analysis technique,point insertion,iterative technique,circular bist methodology,significant new feature,rtl circuit,indirect feedback,built-in self-test,pseudorandom bist,testability analysis,previous approach,controllability,registers,observability,insertion,markov processes,system testing,probability,markov model,modeling | Observability,Markov process,Controllability,Markov model,System testing,Computer science,Algorithm,Preprocessor,Pseudorandom number generator,Built-in self-test | Conference |
ISBN | Citations | PageRank |
0-8186-7165-3 | 18 | 1.00 |
References | Authors | |
9 | 2 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Joan Carletta | 1 | 73 | 11.85 |
| Christos A. Papachristou | 2 | 339 | 39.72 |