Title
An approach to diagnose logical faults in partially observable sequential circuits
Abstract
We propose an approach for locating logical faults in sequential circuits under the condition that all the internal nets are not observable. In this approach, candidates for the error sources are first deduced by an error propagation traceback starting from the failing primary outputs. Then, with the aid of probing, the possible error sources are found. Simulation results for ISCAS'89 benchmark circuits show that a reasonable diagnostic resolution can be achieved by our approach if more than 50% of the internal nets are observable.
Year
DOI
Venue
1997
10.1109/ATS.1997.643954
Asian Test Symposium
Keywords
Field
DocType
possible error source,sequential circuit,benchmark circuit,error source,observable sequential circuit,simulation result,error propagation traceback,internal net,logical fault,reasonable diagnostic resolution,primary output,error propagation,computer science,sequential circuits,vlsi,error correction,probing
Propagation of uncertainty,Observable,Sequential logic,Computer science,Algorithm,Real-time computing,Electronic engineering,Electronic circuit
Conference
ISBN
Citations 
PageRank 
0-8186-8209-4
1
0.40
References 
Authors
10
2
Name
Order
Citations
PageRank
Koji Yamazaki1278.41
Yamada, T.25917.08