Name
Title | ||
|---|---|---|
Low Overhead Partial Enhanced Scan Technique for Compact and High Fault Coverage Transition Delay Test Patterns |
Abstract | ||
|---|---|---|
This paper presents a scan-based DFT technique that uses limited number of enhanced scan cells to reduce volume of delay test patterns and improve delay fault coverage. The proposed method controls a small number of enhanced scan cells by the skewed-load approach and the rest of scan cells by the broadside approach. Inserting enhanced scan cells reduces test data volume and ATPG run time and improves delay fault coverage. Hardware overhead for the proposed method is very low. The scan inputs where enhanced scan cells are inserted are selected by gain functions, which consist of controllability costs and usefulness measures. A regular ATPG can be used to generate transition delay test patterns for the proposed method. Experimental results show that test data volume is reduced by up to 65% and fault coverage is improved by up to about 6%. |
Year | DOI | Venue |
|---|---|---|
2008 | 10.1109/ETS.2008.12 | European Test Symposium |
Keywords | Field | DocType |
delay test patterns,broadside,low overhead partial enhanced scan technique,enhanced scan,broadside approach,regular atpg,fault coverage transition delay test patterns,atpg,dft technique,transition delay fault,test data volume,automatic test pattern generation,low overhead,delay fault coverage,high fault coverage transition,delay test pattern,partial enhanced scan technique,skewed-load approach,design for testability,transition delay test pattern,scan cells,fault coverage,skewed-load,atpg run time,logic testing,limited number,automatic control,signal generators,hardware,national electric code,cost function | Design for testing,Automatic test pattern generation,Fault coverage,Controllability,Computer science,Scan chain,Real-time computing,Electronic engineering,Test data,Test compression,National Electrical Code | Conference |
ISSN | ISBN | Citations |
1530-1877 | 978-0-7695-3150-2 | 11 |
PageRank | References | Authors |
0.69 | 12 | 2 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Seongmoon Wang | 1 | 605 | 48.50 |
| Wenlong Wei | 2 | 81 | 6.50 |