Name
Abstract | ||
|---|---|---|
For ratio-Iddq testing, the test performance is signifl- cantly afiected by the correlation between two currents of difierent input patterns as process parameters vary. In this paper we flrst study the reason for strong corre- lation between Iddq currents for difierent test vectors, then build a model to estimate the correlation. Based on this model, we propose three test vector selection meth- ods to improve the fault detection ability of ratio-Iddq testing by selecting test vector pairs with the highest correlation. Hspice simulation showed that the fault de- tection ability can be improved by as much as an order of magnitude. We also describe a test vector partition- ing technique to increase the correlation between Iddq currents of difierent test vectors. |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1109/TEST.2003.1270881 | ITC |
DocType | Volume | ISSN |
Conference | 1 | 1089-3539 |
ISBN | Citations | PageRank |
0-7803-8106-8 | 0 | 0.34 |
References | Authors | |
4 | 3 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Xiaoyun Sun | 1 | 14 | 2.13 |
| Larry L. Kinney | 2 | 60 | 21.14 |
| Bapiraju Vinnakota | 3 | 237 | 25.36 |