Name
Title | ||
|---|---|---|
Capacitively coupled transmission line pulsing cc-TLP––a traceable and reproducible stress method in the CDM-domain |
Abstract | ||
|---|---|---|
This paper describes a new test method called capacitively coupled transmission line pulsing cc-TLP. It is applied to different test circuits which were mounted on specially designed package emulators with a defined background capacitance. The test results are compared with the ESD thresholds obtained by CDM tests. The cc-TLP results correlate well with the CDM data. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1016/j.microrel.2004.05.015 | Microelectronics Reliability |
Keywords | Field | DocType |
ESD,CDM,cc-TLP,vf-TLP,Package emulator,Protection element,Gate monitor | Test method,Capacitance,Transmission line,Electrostatic discharge,Electric power transmission,Electronic engineering,Engineering,Electronic circuit,Electrical engineering | Journal |
Volume | Issue | ISSN |
45 | 2 | 0026-2714 |
Citations | PageRank | References |
3 | 1.02 | 0 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Heinrich Wolf | 1 | 3 | 1.35 |
| Horst Gieser | 2 | 10 | 3.34 |
| Wolfgang Stadler | 3 | 13 | 4.75 |
| Wolfgang Wilkening | 4 | 3 | 1.35 |