Author Info
Name
Affiliation
Papers
HORST GIESER
Fraunhofer-Institut Zuverlässigkeit und Mikrointegration (IZM-M/ATIS Analysis and Test of Integrated Systems), Hansastr. 27d, 80686 Munich, Germany
6
Collaborators
Citations 
PageRank 
25
10
3.34
Referers 
Referees 
References 
30
28
6
Title
Citations
PageRank
Year
Verification of physical designs using an integrated reverse engineering flow for nanoscale technologies10.402020
Integrated flow for reverse engineering of nanoscale technologies.20.412019
Investigating the CDM susceptibility of IC’s at package and wafer level by capacitive coupled TLP30.562009
ESD Susceptibility of Submicron Air Gaps00.342006
Capacitively coupled transmission line pulsing cc-TLP––a traceable and reproducible stress method in the CDM-domain31.022005
A Dedicated TLP Set-Up to Investigate the ESD Robustness of RF Elements and Circuits10.632005