Paper Info
Title
Aging effects of leakage optimizations for caches
Abstract
Besides static power consumption, sub-90nm devices have to account for NBTI effects, which are one of the major concerns about system reliability. Some of the factors that regulate power consumption also impact NBTI-induced aging effects; however, to which extent traditional low-power techniques can mitigate NBTI issues has not been investigated thoroughly. This is especially true for cache memories, which are the target of this work. We show how leakage optimization techniques can also be leveraged to extend the lifetime a cache. Experimental analysis points out that, while achieving a total energy reduction up to 80\%, managing static power can also provide a 5x factor on lifetime extension.
Year
DOI
Venue
2010
10.1145/1785481.1785504
ACM Great Lakes Symposium on VLSI
Keywords
Field
DocType
experimental analysis point,static power,leakage optimizations,cache memory,extent traditional low-power technique,nbti effect,lifetime extension,nbti issue,leakage optimization technique,static power consumption,power consumption,experimental analysis,aging
Memory hierarchy,Leakage (electronics),Computer science,Cache,Real-time computing,Lifetime extension,Energy reduction,Power consumption,Embedded system
Conference
Citations 
PageRank 
References 
9
0.64
11
Authors
4
Name
Order
Citations
PageRank
Andrea Calimera129338.89
Mirko Loghi221817.83
Enrico Macii32405349.96
Massimo Poncino446057.48