Name
Title | ||
|---|---|---|
March Pre: an Efficient Test for Resistive-Open Defects in the SRAM Pre-charge Circuit |
Abstract | ||
|---|---|---|
In this paper, we first present an exhaustive study on the influence of resistive-open defects in the precharge circuit of SRAMs. We show that these defects may disturb the pre-charge circuit, thus disturbing the read operation. This faulty behavior can be modeled by two types of dynamic faults called Un-Restored Write Faults (URWFs) and Un-Restored Read Faults (URRFs). For this type of faults, we next propose a new test algorithm called March Pre. The main advantage of March Pre is its complexity, which is twice lower (2.5N) than that of the reference MATS+ algorithm (5N). On the other side, an obvious shortcoming is that it targets only faults in pre-charge circuits. However, with its properties, March Pre makes the test but also the diagnosis easier in SRAM memories sensitive to pre-charge defects. |
Year | DOI | Venue |
|---|---|---|
2006 | 10.1109/DDECS.2006.1649631 | DDECS |
Keywords | Field | DocType |
sram pre-charge circuit,efficient test,resistive-open defects,system on a chip,robots,fault detection,government | System on a chip,Test algorithm,Fault detection and isolation,Computer science,Resistive touchscreen,Static random-access memory,Electronic engineering,Real-time computing,Pre-charge,Electronic circuit | Conference |
ISSN | ISBN | Citations |
2334-3133 | 1-4244-0185-2 | 2 |
PageRank | References | Authors |
0.42 | 9 | 5 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| L. Dilillo | 1 | 44 | 9.49 |
| P. Girard | 2 | 478 | 41.91 |
| S. Pravossoudovitch | 3 | 689 | 54.12 |
| A. Virazel | 4 | 169 | 23.25 |
| M. Bastian | 5 | 25 | 3.82 |