Name
Abstract | ||
|---|---|---|
In systems consisting of interacting datapaths and controllersand utilizing built-in self test (BIST), the datapaths andcontrollers are traditionally tested separately by isolatingeach component from the environment of the system duringtest.This work facilitates the testing of datapath-controllerpairs in an integrated fashion.The key to the approach isthe addition of logic to the system that interacts with theexisting controller to push the effects of controller faults intothe data flow, so that they can be observed at the datapathregisters rather than directly at the controller outputs.Theresult is to reduce the BIST overhead over what is neededif the datapath and controller are tested independently, andto allow a more complete test of the interface between datapathand controller.Fault coverage and overhead resultsare given for four example circuits. |
Year | DOI | Venue |
|---|---|---|
1997 | 10.1145/266021.266280 | DAC |
Keywords | Field | DocType |
bist overhead,integrated controller-datapath fault testing,datapathand controller,controller faults intothe data,theexisting controller,system duringtest,overhead resultsare,controller output,interacting datapaths,complete test,datapaths andcontrollers,data flow,system testing,control systems,integer linear programming,logic,covering problems,fault coverage,data engineering | Control theory,Datapath,Integration testing,System testing,Computer science,White-box testing,Real-time computing,Electronic engineering,Model-based testing,Data flow diagram,Embedded system,Built-in self-test | Conference |
ISSN | ISBN | Citations |
0738-100X | 0-89791-920-3 | 14 |
PageRank | References | Authors |
1.03 | 14 | 3 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| M. Nourani | 1 | 149 | 15.25 |
| J. Carletta | 2 | 37 | 2.86 |
| C. Papachristou | 3 | 56 | 5.81 |