Title
Parametric Model Fitting: From Inlier Characterization to Outlier Detection
Abstract
Parametric models play an important role in broad areas of science and technology. This paper presents a novel framework for the fitting of multiple parametric models. It comprises of a module for parameter estimation based on a solution for generalized least squares problems and of a procedure for error propagation, which takes both the geometric arrangement of the input data points and their precision into account. The results from error propagation are used to complement each model parameter with a precision estimate, to assign an inlier set of data points supporting the fit to each extracted model, and to determine the a priori unknown total number of meaningful models in the data. Although the models are extracted sequentially, the final result is almost independent of the extraction order. This is achieved by further statistical processing which controls the mutual exchange of inlier data between the models. Consequently, sound data classification as well as robust fitting are guaranteed even in areas where different models intersect or touch each other. Apart from the input data and its precision, the framework relies on only one additional control parameter: the confidence level on which the various statistical tests for data and model classification are carried out. We demonstrate the algorithmic performance by fitting straight lines in 2D and planes in 3D with applications to problems of computer vision and pattern recognition. Synthetic data is used to show the robustness and accuracy of the scheme. Image data and range data are used to illustrate its applicability and relevance in respect of real-world problems, e.g., in the domain of image feature extraction.
Year
DOI
Venue
1998
10.1109/34.667884
IEEE Trans. Pattern Anal. Mach. Intell.
Keywords
Field
DocType
inlier characterization,input data,image data,data point,outlier detection,sound data classification,inlier data,input data point,different models intersect,error propagation,synthetic data,range data,parametric model fitting,data snooping,robustness,feature extraction,parametric models,pattern recognition,process control,computer vision,confidence level,statistical test,indexing terms,parametric model,image features,statistical tests,least squares approximation,application software,statistical analysis,testing,parameter estimation,parametric statistics,data mining,generalized least squares,errors in variables
Data point,Errors-in-variables models,Parametric model,Pattern recognition,Computer science,Feature extraction,Robustness (computer science),Synthetic data,Artificial intelligence,Data classification,Statistical hypothesis testing
Journal
Volume
Issue
ISSN
20
3
0162-8828
Citations 
PageRank 
References 
36
1.90
26
Authors
2
Name
Order
Citations
PageRank
Gaudenz Danuser1525.64
Markus A. Stricker2361.90