Name
Abstract | ||
|---|---|---|
With shrinking of LSIs, the diversification of defective mode becomes a critical issue. As a result, test patterns for stuck-at faults and transition faults are insufficient to detect such defects. N-detection tests have been known as an effective way for achieving high defect coverage, but the large number of test pattern counts is the problem. In this paper, we propose metrics based on the fault excitation functions and the propagation path function to evaluate test patterns for transition faults. We also propose the method for selecting the test patterns from the N-detection test set. From the experimental results, we show that the set of selected test patterns can detect the larger number of faults than other test set with the same number of test patterns. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/ATS.2011.24 | Asian Test Symposium |
Keywords | Field | DocType |
defective mode,defect-aware test,selected test pattern,n-detection test set,n-detection test,test pattern selection,large number,transition fault,critical issue,larger number,test pattern count,test pattern,logic gates,fault detection,logic gate,automatic test pattern generation | Process function,Automatic test pattern generation,Logic gate,Pattern selection,Fault coverage,Computer science,Fault detection and isolation,Real-time computing,Electronic engineering,Test compression,Test set | Conference |
ISSN | Citations | PageRank |
1081-7735 | 0 | 0.34 |
References | Authors | |
7 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Yoshinobu Higami | 1 | 140 | 27.24 |
| Hiroshi Furutani | 2 | 54 | 22.85 |
| Takao Sakai | 3 | 1 | 0.69 |
| Shuichi Kameyama | 4 | 0 | 1.01 |
| Hiroshi Takahashi | 5 | 148 | 24.32 |