Paper Info
Title
A new ATPG algorithm to limit test set size and achieve multiple detections of all faults
Abstract
Deterministic observation and random excitation of fault sites during the ATPG process dramatically reduces the overall defective part level. However, multiple observations of each fault site lead to increased test set size and require more tester memory. In this paper we propose a new ATPG algorithm to find a near-minimal test pattern set that detects faults multiple times and achieves excellent defective part level. This greedy approach uses 3-value fault simulation to estimate the potential value of each vector candidate at each stage of ATPG. The result shows generation of a close to minimal vector set is possible only using dynamic compaction techniques in most cases. Finally, a systematic method to trade-off between defective part level and test size is also presented
Year
DOI
Venue
2002
10.1109/DATE.2002.998255
DATE
Keywords
Field
DocType
new atpg algorithm,fault site lead,3-value fault simulationto,fault simulation,detectsfaults multiple time,atpg process,defective part level,increased test set size,theoverall defective part level,automatic test pattern generation,test set size,achieve multiple detections,atpg algorithm,multiple fault detection,minimal vector set,limit test set size,dynamic compaction,excellent defectivepart level,near-minimal test pattern,manufacturing,fault detection,predictive models,drams,system testing,compaction
Dram,Automatic test pattern generation,Dynamic compaction,Computer science,System testing,Fault detection and isolation,Algorithm,Memory testing,Test pattern generators,Real-time computing,Test set
Conference
ISSN
ISBN
Citations 
1530-1591
0-7695-1471-5
25
PageRank 
References 
Authors
1.39
3
5
Name
Order
Citations
PageRank
Seungjoon Lee1132892.31
B. Cobb2251.39
Jennifer Dworak313211.63
Michael R. Grimaila426429.53
M. Ray Mercer5679108.73