Name
Title | ||
|---|---|---|
Random Pattern Testability of the Open Defect Detection Method using Application of Time-variable Electric Field |
Abstract | ||
|---|---|---|
In this paper, random pattern testability of the open defect defection method is discussed. In the test method, time-variable electric field is applied from the outside of ICs so as to vary the voltage at floating nodes caused by a defect. To detect opens the excessive supply current caused by the applied electric field is measured. The test pattern requirements for detecting opens are shown. The fault coverage for open defects is calculated for benchmark circuits. The experimental results shows random pattern can be effectively utilized for the test method even if it cannot attain high fault coverage for stuck-at faults. |
Year | DOI | Venue |
|---|---|---|
2002 | 10.1109/DELTA.2002.994656 | Christchurch |
Keywords | Field | DocType |
detection method,test method,test pattern requirement,stuck-at fault,random pattern testability,open defect,open defect defection method,random pattern,electric field,high fault coverage,time-variable electric field,fault coverage,automatic test pattern generation,test methods,cmos,electric fields,voltage | Testability,Test method,Automatic test pattern generation,Electric field,Fault coverage,Computer science,Voltage,Electronic engineering,Electronic circuit,Test compression | Conference |
ISBN | Citations | PageRank |
0-7695-1453-7 | 0 | 0.34 |
References | Authors | |
3 | 5 | |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Hiroyuki Yotsuyanagi | 1 | 70 | 19.04 |
| Masaki Hashizume | 2 | 98 | 27.83 |
| Taisuke Iwakiri | 3 | 2 | 0.89 |
| Masahiro Ichimiya | 4 | 4 | 2.36 |
| Takeomi Tamesada | 5 | 45 | 12.49 |