Name
Abstract | ||
|---|---|---|
We describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The principal problem that we address is of parameter identification, given insufficient data, that we address by making conservative assumptions on the property being measured and the associated parameter values. Several cases of commonly occurring test types, in the manufacture of electronic products, are considered. |
Year | DOI | Venue |
|---|---|---|
2007 | 10.1109/VTS.2007.48 | VTS |
Keywords | Field | DocType |
associated parameter value,repair model,parameter estimation,parameter identification,test type,electronic product,conservative assumption,manufacturing test,imperfect testing,imperfect repair,imperfect test,insufficient data,cost function,assembly,computer aided manufacturing,mathematical model,statistics | Computer-aided manufacturing,Imperfect,Computer science,Test types,Estimation theory,Reliability engineering | Conference |
ISSN | ISBN | Citations |
1093-0167 | 0-7695-2812-0 | 0 |
PageRank | References | Authors |
0.34 | 4 | 7 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Simon Wilson | 1 | 20 | 5.54 |
| Ben Flood | 2 | 0 | 1.01 |
| suresh goyal | 3 | 120 | 13.77 |
| Jim Mosher | 4 | 0 | 0.34 |
| Susan Bergin | 5 | 162 | 21.31 |
| Joseph O'Brien | 6 | 0 | 0.34 |
| Robert Kennedy | 7 | 0 | 0.34 |