Title
Design Of Dynamically Assignmentable Tam Width For Testing Core-Based Socs
Abstract
Test access mechanism (TAM) and testing schedule for System-On-Chip (SOC) are challenging problems. Testing schedule must be effective to minimize testing time, under the constraint of test resources. This paper we presents a new method based on genealized rectangle packing, as two-dimensional pacidng. A core cuts into many pieces and utilize the design of reconfigurable core wrappers, and is dynamic to change the width of the TAM executing the core test. Therefore, a core can utilize different TAM width to complete test.
Year
DOI
Venue
2006
10.1109/APCCAS.2006.342462
2006 IEEE ASIA PACIFIC CONFERENCE ON CIRCUITS AND SYSTEMS
Keywords
Field
DocType
SOC testing, TANL testing scheduling
Design for testing,System on a chip,Computer science,Scheduling (computing),Embedded system,Rectangle packing
Conference
Citations 
PageRank 
References 
0
0.34
4
Authors
3
Name
Order
Citations
PageRank
Jiann-Chyi Rau1136.75
Chien-shiun Chen2121.60
Po-han Wu348231.49