Name
Abstract | ||
|---|---|---|
Test generation using deterministic faultorientedalgorithms is highly complex and time-consuming.New approaches are needed to augment theexisting techniques, both to reduce execution time andto improve fault coverage. In this work, we describe agenetic algorithm (GA) framework for sequential circuittest generation. The GA evolves candidate testvectors and sequences, using a fault simulator to computethe fitness of each candidate test. Various GA parametersare studied, including... |
Year | DOI | Venue |
|---|---|---|
1994 | 10.1145/196244.196619 | DAC |
Keywords | Field | DocType |
genetic algorithm framework,sequential circuit test generation,fitness function,genetic algorithms,benchmark testing,sequential analysis,fault coverage,forward contracts,system testing,genetic algorithm,population size,sequential circuits,mutation rate | Automatic test pattern generation,Crossover,Sequential logic,Fault coverage,Computer science,Algorithm,Fitness function,Real-time computing,Fault Simulator,Genetic algorithm,Benchmark (computing) | Conference |
ISSN | ISBN | Citations |
0738-100X | 0-89791-653-0 | 85 |
PageRank | References | Authors |
6.90 | 15 | 4 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| Elizabeth M. Rudnick | 1 | 867 | 76.37 |
| J. H. Patel | 2 | 4577 | 527.59 |
| Gary S. Greenstein | 3 | 86 | 7.25 |
| Thomas M. Niermann | 4 | 223 | 22.30 |