Title
STAR-ATPG: A High Speed Test Pattern Generator for Large Scan Designs
Abstract
Star test is a novel test pattern generation technique inwhich a few test vectors serve as centers of clusters for othertest vectors which are derived by complementing at randomtheir coordinates. By properly selecting the deterministicpatterns as centers, the star tests have very high probabilityto detect most of the faults in a circuit. This paper presentsan efficient algorithm to combine the star test approach witha traditional test pattern generator yielding a significantspeed up of the ATPG process. With the new STAR-ATPGmethodology, the major effort of the test generation is transferredfrom an computationally more complex test patterngeneration process into simpler fault simulation. Experimentalresults on several large industrial designs demonstratethat a factor of 1.5-2.5 average speed up is achieved by thenew method with the same abort limit. Also, STAR-ATPGachieves higher fault coverage than traditional ATPG underthe same abort limit. To achieve the same fault coverage asSTAR-ATPG, it requires the traditional method to increasethe abort limit significantly and result in 5 times slower.
Year
DOI
Venue
1999
10.1109/TEST.1999.805835
ITC
Keywords
Field
DocType
large scan designs,traditional test pattern generator,test vector,novel test pattern generation,star test,star test approach witha,test generation,abort limit,star-atpgachieves higher fault coverage,high speed,fault coverage asstar-atpg,complex test patterngeneration process,test pattern generator,combinational circuits,fault coverage,clustering algorithms,industrial design,graphics,fault detection,automatic test pattern generation
Abort,Automatic test pattern generation,Fault coverage,Fault detection and isolation,Computer science,Real-time computing,Electronic engineering,Combinational logic,Test compression,Cluster analysis,Speedup
Conference
ISBN
Citations 
PageRank 
0-7803-5753-1
8
0.55
References 
Authors
15
4
Name
Order
Citations
PageRank
Kun-Han Tsai160040.79
R. Tompson280.55
J. Rajski398563.36
Malgorzata Marek-Sadowska42272213.72