| Cell-Aware Test | 39 | 2.06 | 2014 |
| Low power programmable PRPG with enhanced fault coverage gradient | 2 | 0.38 | 2012 |
| Low power test application with selective compaction in VLSI designs | 2 | 0.41 | 2012 |
| Cell-aware Production test results from a 32-nm notebook processor | 2 | 0.41 | 2012 |
| Reduced ATE Interface for High Test Data Compression | 2 | 0.39 | 2011 |
| Deterministic Clustering of Incompatible Test Cubes for Higher Power-Aware EDT Compression | 24 | 0.88 | 2011 |
| Fault Diagnosis For Embedded Read-Only Memories | 6 | 0.56 | 2009 |
| X-Press: Two-Stage X-Tolerant Compactor With Programmable Selector | 26 | 0.86 | 2008 |
| Low Power Scan Shift And Capture In The Edt Environment | 36 | 1.18 | 2008 |
| Low-Power Test Data Application in EDT Environment Through Decompressor Freeze | 16 | 0.60 | 2008 |
| Improving the Resolution of Single-Delay-Fault Diagnosis | 3 | 0.50 | 2008 |
| Enhancing Delay Fault Coverage Through Low-Power Segmented Scan | 21 | 0.77 | 2007 |
| Fault Diagnosis With Convolutional Compactors | 7 | 0.48 | 2007 |
| Analysis and methodology for multiple-fault diagnosis | 23 | 0.97 | 2006 |
| X-Press Compactor for 1000x Reduction of Test Data | 26 | 1.01 | 2006 |
| Finite memory test response compactors for embedded test applications | 38 | 1.15 | 2005 |
| Embedded deterministic test | 254 | 7.20 | 2004 |
| Ring generators - new devices for embedded test applications | 53 | 2.08 | 2004 |
| Finding a common fault response for diagnosis during silicon debug | 1 | 0.35 | 2002 |
| Cellular automata-based test pattern generators with phase shifters | 14 | 0.99 | 2000 |
| Improving the proportion of at-speed tests in scan BIST | 8 | 0.55 | 2000 |
| Testing of telecommunications hardware [Guest Editorial] | 0 | 0.34 | 1999 |
| STAR-ATPG: A High Speed Test Pattern Generator for Large Scan Designs | 8 | 0.55 | 1999 |
| Comparative study of CA-based PRPGs and LFSRs with phase shifters | 15 | 1.66 | 1999 |
| STARBIST: scan autocorrelated random pattern generation | 22 | 1.60 | 1997 |
| A self-driven test structure for pseudorandom testing of non-scan sequential circuits | 3 | 0.55 | 1996 |
| A complexity analysis of sequential ATPG | 5 | 0.47 | 1996 |
| Decompression of test data using variable-length seed LFSRs | 49 | 4.39 | 1995 |
| Fault coverage analysis of RAM test algorithms | 7 | 1.24 | 1995 |
| Software accelerated functional fault simulation for data-path architectures | 3 | 0.43 | 1995 |
| Arithmetic built-in self test for high-level synthesis | 33 | 1.69 | 1995 |
| On necessary and nonconflicting assignments in algorithmic test pattern generation | 23 | 2.03 | 1994 |
| Delay-fault testability preservation of the concurrent decomposition and factorization transformations | 3 | 0.44 | 1994 |
| Recursive pseudoexhaustive test pattern generation | 8 | 1.11 | 1993 |
| Test responses compaction in accumulators with rotate carry adders | 25 | 1.63 | 1993 |
| The testability-preserving concurrent decomposition and factorization of Boolean expressions | 40 | 4.38 | 1992 |
| BIST of PCB interconnects using boundary-scan architecture | 17 | 0.94 | 1992 |
| On the diagnostic properties of linear feedback shift registers | 16 | 1.87 | 1991 |
| On the diagnostic resolution of signature analysis | 0 | 0.34 | 1990 |
| A method to calculate necessary assignments in algorithmic test pattern generation | 50 | 9.97 | 1990 |
| A method of fault analysis for test generation and fault diagnosis | 49 | 3.12 | 1988 |
| The Influence of Masking Phenomenon on Coverage Capability of Single Fault Test Sets in PLA's | 6 | 0.83 | 1986 |
