Paper Info
Title
Virtual Instrumentation Based IC Parametric Tester for Engineering Education
Abstract
Importance of training in electronic test technology within a wider electronic education framework has been acknowledged and extensively discussed in the literature. The main difficulty in incorporating test technology education and training into a curriculum of an electronic engineering degree offered by higher education institutions is an extremely high cost of industry-grate automated test equipment. Trying to address this shortcoming, this paper proposes a fully operational prototype of a simple low-cost programmable electronic test system for functional and DC parametric testing of simple logic ICs. The system is based on National Instruments tools and software. It has been developed to aid teaching of undergraduate units ECE4064 Electronic Test Technology offered at Monash University, Malaysia and 143 .457 Advanced Micro Technologies offered at Massey University, New Zealand.
Year
DOI
Venue
2010
10.1109/DELTA.2010.71
Ho Chi Minh City
Keywords
Field
DocType
monash university,wider electronic education framework,engineering education,electronic engineering degree,low-cost programmable electronic test,virtual instrumentation,simple logic ics,higher education institution,massey university,test technology education,ic parametric tester,electronic test technology,industry-grate automated test equipment,hardware,data acquisition,parametric testing,automated test equipment,technology education,functional testing,logic gates,testing,multiplexing
Logic gate,Automatic test equipment,Computer science,Technology education,Virtual instrumentation,Engineering education,Electronic engineering,Software,Curriculum,Higher education
Conference
ISBN
Citations 
PageRank 
978-1-4244-6026-7
0
0.34
References 
Authors
5
4
Name
Order
Citations
PageRank
Loren Nolan100.34
Chew Moi Tin2257.14
Serge Demidenko3477.78
Melanie Po-Leen Ooi47018.35