Name
Abstract | ||
|---|---|---|
Technology trends are increasing the frequency of serious transient (soft) faults in digital systems. For example, ICs are becoming more susceptible to cosmic radiation, and are being embedded in applications with dynamic noisy environ- ments. We propose a generic framework for representing such faults and characterizing them on-line. We formally define the impact of a transient fault in terms of three ba- sic parameters: frequency, observability and severity. We distinguish fault modes in systems whose noise environment changes dynamically. Based on these ideas, the problem of designing on-line architectures for transient fault character- ization is formulated and analyzed for several optimization goals. Finally, experiments are described that determine transient fault impact and the corresponding tests for various simulated fault modes of the ISCAS-89 benchmark circuits. |
Year | DOI | Venue |
|---|---|---|
2005 | 10.1109/TEST.2005.1584070 | ITC |
Keywords | Field | DocType |
soft faults,fault modeling,transient faults,on-line char- acterization,fault detection,fault model | Stuck-at fault,Observability,Fault modeling,Fault detection and isolation,Computer science,Circuit noise,Real-time computing,Electronic engineering,Control engineering,Transient analysis,Electronic circuit | Conference |
Citations | PageRank | References |
21 | 1.56 | 10 |
Authors | ||
4 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Ilia Polian | 1 | 889 | 78.66 |
| John P. Hayes | 2 | 28 | 2.15 |
| Sandip Kundu | 3 | 1103 | 137.18 |
| Bernd Becker | 4 | 345 | 31.68 |