Paper Info
Title
Statistical Threshold Formulation For Dynamic I-Dd Test
Abstract
Dynamic I-dd techniques can potentially address the limitations of traditional test techniques and the I-dd, test. Normal process variations in manufacturing affect dynamic Idd techniques in two ways. Since a fault-free circuit can produce a range of responses, they necessitate the use of a threshold-based test process. Process variations also degrade the resolution and consequently the fault coverage of a test technique. The authors develop statistical techniques to set thresholds in a dynamic I-dd test process. The techniques use Principal Component Analysis, a statistical analysis technique, to identify process corners and compute statistical models. Our techniques are applied to average current-based dynamic tests and to tests based on the energy consumption ratio (ECR). The ECR is a new test metric which offers several advantages, including tolerance to process variations, over other dynamic test techniques. The authors demonstrate that their techniques lead to computationally efficient methods to set accurate thresholds without either significant yield or fault coverage loss. To the best of their knowledge, this is the first systematic technique to set thresholds for a dynamic I-dd test method.
Year
DOI
Venue
1999
10.1109/TCAD.2002.1004313
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Keywords
DocType
Volume
dynamic current test, MOSFET modeling, principal component analysis, process variation, threshold
Conference
21
Issue
ISSN
Citations 
6
0278-0070
10
PageRank 
References 
Authors
0.68
9
2
Name
Order
Citations
PageRank
Wanli Jiang11139.16
Bapiraju Vinnakota223725.36