Paper Info
Title
Automatic Functional Stress Pattern Generation for SoC Reliability Characterization
Abstract
Reliability testing is increasingly used not only to reduce Infant Mortality effects, but also for Reliability Characterization. This paper first discusses the characteristics of the stimuli to be used during Reliability Characterization experiments, and outlines the importance of adopting a functional approach. Secondly, the paper describes a novel approach to automatically generate suitable stress patterns to be used during the Reliability characterization process of Systems-on-chip. The generation process uses an evolutionary algorithm driven by suitable state toggling-related metrics purposely defined in the paper.Costs and benefits of the proposed approach are highlighted, supported by the results gathered on a test vehicle released on a 90nm technology.
Year
DOI
Venue
2009
10.1109/ETS.2009.16
European Test Symposium
Keywords
Field
DocType
generation process,soc reliability characterization,pattern generation,reliability characterization,functional approach,novel approach,suitable stress pattern,suitable state,automatic functional stress,infant mortality effect,reliability characterization experiment,reliability characterization process,automotive engineering,evolutionary algorithm,system on a chip,infant mortality,system on chip,stress,automatic test pattern generation,bismuth,costs and benefits
Automatic test pattern generation,System on a chip,Pattern generation,Evolutionary algorithm,Functional approach,Computer science,Electronic engineering,Reliability engineering
Conference
ISSN
Citations 
PageRank 
1530-1877
2
0.44
References 
Authors
6
7
Name
Order
Citations
PageRank
D. Appello1687.84
P. Bernardi214416.93
R. Cagliesi381.05
M. Giancarlini481.05
M. Grosso510911.39
E. Sanchez613016.50
M. Sonza Reorda71099114.76