Name
Abstract | ||
|---|---|---|
This paper presents a novel scheme to address the challenge of identifying failing scan cells from production test responses in the presence of scan compression. The scheme is based on a very simple test response compactor employing orthogonal - spatial and time - signatures. The advantage of this scheme as compared to previous work in this field is the simple and incremental nature of the compaction hardware required. The ability of the scheme to accurately identify failing scan cells from compacted responses has been measured on production fail data from five industrial designs and is reported herein. |
Year | DOI | Venue |
|---|---|---|
2011 | 10.1109/ETS.2011.56 | ETS '11 Proceedings of the 2011 Sixteenth IEEE European Test Symposium |
Keywords | DocType | ISSN |
novel scheme,incremental nature,failing scan cells,test response compactor,production test responses,previous work,production test response,failing scan cell identification,orthogonal response compaction,compaction hardware,orthogonal-time signature,built-in self test,scan compression,fault diagnosis,failing scan cell diagnosis,logic design,xor compactor,compacted response,orthogonal-spatial signature,simple test response compactor,industrial design,production fail data,logic testing,hardware,bipartite graph,logic gates,failure analysis,compaction,automata,testing,production,graphics,polynomials | Conference | 1530-1877 |
Citations | PageRank | References |
2 | 0.37 | 22 |
Authors | ||
6 | ||
Name | Order | Citations | PageRank |
|---|---|---|---|
| Brady Benware | 1 | 271 | 19.43 |
| Grzegorz Mrugalski | 2 | 501 | 35.90 |
| Artur Pogiel | 3 | 22 | 4.38 |
| Janusz Rajski | 4 | 2460 | 201.28 |
| Jĕdrzej Solecki | 5 | 28 | 4.07 |
| Jerzy Tyszer | 6 | 838 | 74.98 |