Name
Abstract | ||
|---|---|---|
Abstract: A methodology for evaluating the fault coverage of RAM test algorithms is proposed and the architecture of a flexible software analysis program is described. The analysis, performed for arbitrary test sequences, provides a comprehensive set of coverage statistics for functional cell-array faults. An overview of the analysis capabilities of the program is given, the fault state transition conditions for several representative fault classes are specified, and coverage analyses results for a variety of test algorithms are presented. |
Year | Venue | Keywords |
|---|---|---|
1995 | VTS | fault coverage analysis,coverage statistic,flexible software analysis program,fault state transition condition,ram test algorithm,representative fault class,coverage analyses result,arbitrary test sequence,analysis capability,functional cell-array fault,fault coverage,state transition,software analysis |
Field | DocType | ISBN |
Code coverage,Automatic test pattern generation,Architecture,Fault coverage,Test algorithm,Computer science,Software analysis pattern,Real-time computing | Conference | 0-8186-7000-2 |
Citations | PageRank | References |
7 | 1.24 | 5 |
Authors | ||
2 | ||