Name
Abstract | ||
|---|---|---|
Debug of the latest ICs may be tackled with Time Resolved Photoemission, which is also known as PICA (Picosecond Imaging Circuit Analysis). The main drawback of this technique is the long acquisition time, up to several hours, due to the detector poor quantum efficiency. The challenge is to identify photons from switching transistors (signal) from the noise. Furthermore, it is difficult to distinguish two nearby emitting transistors with the shrinkage of technologies. After reviewing photon emission physics in silicon, we will address practical considerations to optimize the Time Resolved Photoemission technique. Our goal is to obtain high-resolution PICA data in the shortest time. (C) 2003 Elsevier Ltd. All rights reserved. |
Year | DOI | Venue |
|---|---|---|
2003 | 10.1016/S0026-2714(03)00288-9 | Microelectronics Reliability |
Field | DocType | Volume |
Engineering physics,Electronic engineering,Engineering | Journal | 43 |
Issue | ISSN | Citations |
9 | 0026-2714 | 0 |
PageRank | References | Authors |
0.34 | 0 | 6 |
Name | Order | Citations | PageRank |
|---|---|---|---|
| M. Remmach | 1 | 6 | 2.03 |
| R. Desplats | 2 | 40 | 15.34 |
| F. Beaudoin | 3 | 20 | 10.73 |
| E. Frances | 4 | 0 | 0.34 |
| P. Perdu | 5 | 60 | 27.38 |
| D. Lewis | 6 | 36 | 8.96 |